Dr.-Ing. Thomas Hinterholzer

Dr.-Ing. Thomas Hinterholzer
Senior Scientist

Technische Universität München
Professorship of High Voltage Engineering and Switchgear Technology
Arcisstr. 21
80333 Munich

Phone: +49.89.289.22009
Fax:     +49.89.289.25089
Building: N2 (Theresienstr. 90)
Room: N2206

E-mail: thomas.hinterholzer@tum.de

Teaching

  • supports the lecture Electrical Power Engineering (Elektrische Energietechnik)
  • supports the lecture High Voltage Measurement and Test Techniques (Hochspannungsprüf- und Messtechnik)
  • supports the lecture Electromagnetic Compatibility in the Field of Power Engineering (EMV in der Energietechnik)
  • supports the Laboratory course on high voltage engineering and electric power transmission (Praktikum Hochspannungs- und Energieübertragungstechnik)

Dissertation

  • Hinterholzer, Thomas: Der Durchschlag in SF6 unter Einfluss der Raumladungsstabilisierung. Dissertation, 2002 more…

Publications

2013

  • Bissle, G.; Hinterholzer, T.: Abgesicherte Hochspannungsprüfung. ETZ Elektrotechnik und Automation (11/2013), 2013 more…

2003

  • Hinterholzer, Th.; Boeck, W.: Breakdown behaviour in SF6 influenced by space-charge-stabilization. XIIIth International Symposium on High Voltage Engineering (Proceedings of the XIIIth International Symposium on High Voltage Engineering), 2003Delft, Netherlands, August 25-29, 2003 more…

2001

  • Hinterholzer, Th.: Space-charge-stabilization in SF6. International Conference on Advances in Processing, Testing and Application of Dielectric Materials (APTADM), Wroclaw, Poland, September 17.-19, 2001 (2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)), 2001Kitchener, Ontario, Canada, October 14-17, 2001 , 392 - 396 more…
  • Hinterholzer, Th.; Taschner, W.; Boeck, W.: The influence of space-charge on the breakdown in SF6. 9th International Symposium on Gaseous Dielectrics (Proceedings of the 9th International Symposium on Gaseous Dielectrics), 2001Elicott City, Maryland, USA, May 21-25, 2001 more…

2000

  • Hinterholzer, T.; Boeck, W.: Breakdown in SF6 influenced by Corona-Stabilization. Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) (2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena), 2000Victoria, British Columbia, Oct. 15-18, 2000, 413 - 416 more…