Here, we show that the voltage hold and the voltage decay methods deliver comparable results when determining the differential capacity with an incremental capacity analysis (ICA) instead of a single pulse for the voltage decay method. Both methods presented a good agreement for high temperatures and high SoC cases. In addition, with the end of charge point and end of discharge point slippage evaluation, it was possible to observe that couple side reactions dominate the leakage currents at higher SoCs and lead to reversible losses. The irreversible losses remain almost constant for SoCs higher than 50%.

link: DOI 10.1149/1945-7111/accb69